Using a portable IR spectrometer for materials characterization and identification

Abstract This work is an assessment of contactless techniques for space hardware ground testing and characterization. It based on Fourier Transform Infrared (FT-IR) spectroscopy, namely a commercially available portable FT-IR instrument operating in reflection transmission measurements at considerable distance from the measured surfaces. The two methodologies are evaluated related to 1) molecular contamination monitoring, 2) materials identification. These can provide important information support Manufacturing, Assembly, Integration Testing activities as well non-conformance investigations. Non-contact characterization particularly relevant when dealing with sensitive surfaces and/or limited access such optical components already integrated bench.